Methods for determining the leaf area index of spring wheat: A leaf area meter was used to obtain the spring wheat leaf area index. In order to ensure the high accuracy of observation data, the leaf area index was used to measure the leaf area index at the same time. At the same time, 15 sampling points were randomly taken and corrected by manual sampling method.
The specific method of correction is to first count the number of spring wheat within the sampling range (60cm×60cm), then select a representative number of 10 spring wheats in the sampling area to observe the number of leaves per plant, and then select a representative number of 20 leaves. A leaf area meter was used to determine the area of ​​a single leaf. All the sample leaves were placed flat on a sheet of white paper of known area. A photo was taken at a height of about 1.5 m from the blade. The ratio of the leaf area to the paper area was determined by the same method as the test coverage, and the blade was calculated. The area.
To ensure high-precision observation of the leaf area index of spring wheat, the leaf area index obtained by the leaf area instrument was corrected by manual sampling. The leaf area instrument is used to obtain the effective leaf area index, and the actual leaf area index is calculated based on the manual sampling method. The linear regression relationship between the effective value and the real value is analyzed. The results show that the two have a very significant linear relationship. The correlation coefficient is as high as 0.87. Therefore, it is feasible to use artificial sampling method to correct the leaf area index observed by the leaf area measurement instrument.
During the entire observation period of the leaf area meter, the spring wheat coverage and the leaf area index showed the same trend over time, both peaking first and then decreasing. It is not difficult to find that the spring wheat coverage and leaf area index both reached the maximum around June 22, and June 22 is also the maximum observation date of spring wheat plant height in the study area.
The specific method of correction is to first count the number of spring wheat within the sampling range (60cm×60cm), then select a representative number of 10 spring wheats in the sampling area to observe the number of leaves per plant, and then select a representative number of 20 leaves. A leaf area meter was used to determine the area of ​​a single leaf. All the sample leaves were placed flat on a sheet of white paper of known area. A photo was taken at a height of about 1.5 m from the blade. The ratio of the leaf area to the paper area was determined by the same method as the test coverage, and the blade was calculated. The area.
To ensure high-precision observation of the leaf area index of spring wheat, the leaf area index obtained by the leaf area instrument was corrected by manual sampling. The leaf area instrument is used to obtain the effective leaf area index, and the actual leaf area index is calculated based on the manual sampling method. The linear regression relationship between the effective value and the real value is analyzed. The results show that the two have a very significant linear relationship. The correlation coefficient is as high as 0.87. Therefore, it is feasible to use artificial sampling method to correct the leaf area index observed by the leaf area measurement instrument.
During the entire observation period of the leaf area meter, the spring wheat coverage and the leaf area index showed the same trend over time, both peaking first and then decreasing. It is not difficult to find that the spring wheat coverage and leaf area index both reached the maximum around June 22, and June 22 is also the maximum observation date of spring wheat plant height in the study area.
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